Search results for "Plane of incidence"

showing 3 items of 3 documents

Analysis of photon-scanning tunneling microscope images of inhomogeneous samples: determination of the local refractive index of channel waveguides

1995

Channel waveguides are imaged by a photon-scanning tunneling microscope (PSTM). The polarization of the light and its orientation with respect to the guide axis are shown to be very important parameters in the analysis of the images of such samples. We simulated image formation for the plane of incidence parallel to the axis of the guide. Our theoretical results are qualitatively in agreement with our measurements. These results show the ability of the PSTM to give information about the local refractive-index variations of a sample.

PhysicsImage formationTotal internal reflectionPlane of incidencebusiness.industryPhysics::OpticsPolarization (waves)Atomic and Molecular Physics and OpticsElectronic Optical and Magnetic Materialslaw.inventionLight intensityOpticslawLight beamComputer Vision and Pattern RecognitionScanning tunneling microscopebusinessRefractive indexJournal of the Optical Society of America A
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Design of a real-time spectroscopic rotating compensator ellipsometer without systematic errors

2014

6th International Conference on Spectroscopic Ellipsometry (ICSE), Kyoto, JAPAN, MAY 26-31, 2013; International audience; We describe a spectroscopic ellipsometer in the visible domain (400-800 nm) based on a rotating compensator technology using two detectors. The classical analyzer is replaced by a fixed Rochon birefringent beamsplitter which splits the incidence light wave into two perpendicularly polarized waves, one oriented at +45 degrees and the other one at-45 degrees according to the plane of incidence. Both emergent optical signals are analyzed by two identical CCD detectors which are synchronized by an optical encoder fixed on the shaft of the step-by-step motor of the compensato…

Spectrum analyzerMaterials sciencePlane of incidence02 engineering and technology01 natural sciencesSpectral linelaw.invention010309 opticschemistry.chemical_compoundOpticslaw0103 physical sciencesMaterials ChemistryBismuth tellurideRotary encoderBirefringencebusiness.industryDetectorMetals and Alloys[CHIM.MATE]Chemical Sciences/Material chemistrySurfaces and Interfaces021001 nanoscience & nanotechnologySurfaces Coatings and FilmsElectronic Optical and Magnetic Materialschemistry[ CHIM.MATE ] Chemical Sciences/Material chemistry0210 nano-technologybusinessBeam splitterThin Solid Films
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Determination of the spatial extension of the surface-plasmon evanescent field of a silver film with a photon scanning tunneling microscope.

1993

A photon scanning tunneling microscope is employed to probe the surface-plasmon field in the evanes- cent region of a silver film for p (parallel to the plane of incidence) and s (perpendicular to the plane of incidence) polarizations of the light beam at several angles of incidence near the critical angle. The in- teraction between the field and the probe is measured and compared to theoretical calculations involving a single four-media model. A systematic analysis of images obtained for several positions of the optical fiber above the film is presented and it is shown that, for tip-to-sample distances smaller than half the wavelength of the incoming light, the collected intensity curves a…

Total internal reflectionOptical fiberMicroscopeMaterials sciencebusiness.industryPlane of incidenceSurface plasmonlaw.inventionOpticslawScanning tunneling microscopebusinessRefractive indexPlasmonPhysical review. B, Condensed matter
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